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74AVC9112GTX
+БОМ74AVC9112GT/SOT833/XSON8
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ПроизводительКомпания Nexperia USA Inc.
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Мфр. Часть #74AVC9112GTX
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Лист данных 74AVC9112GTX DataSheet
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Пакет XFDFN-8
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В наличии5153
365 Дни гарантии качества
7*24 часы обслуживания каранти
90-гарантия послепродажного дня
Гарантия подлинного продукта
Спецификации
| Атрибут | Ценность |
| Supplier | Nexperia USA Inc. |
| Package / Case | Tape & Reel (TR),Cut Tape (CT) |
| Series | 74AVC |
| Part Status | Active |
| Type | Fanout Buffer (Distribution) |
| Number of Circuits | 1 |
| Ratio - Input: Output | 1:4 |
| Differential - Input: Output | No/No |
| Input | Clock |
| Output | Clock |
| Voltage - Supply | 0.8V ~ 3.6V |
| Operating Temperature | -40°C ~ 125°C (TA) |
| Mounting Type | Surface Mount |
Обзор
Description
Typical uses include level shifting between voltage domains, buffering or driving buses, and expanding fan‑out in mixed‑voltage systems, all with options such as 3‑state outputs for bus contention avoidance. Operating conditions, input/output levels, drive strength, and exact pinout depend on the specific device variant.
For a precise introduction, consult the official datasheet for 74AVC9112GTX to confirm: device function, Vcc range, I/O characteristics, propagation delays, package type, and recommended operating conditions.
Pinout
Function: 12-bit bidirectional buffer/line transceiver with tri‑state (3‑state) outputs, used to transfer data between two buses (often with level shifting).
Manufacturer
- What kind of company: A global semiconductor company that designs and manufactures standard logic devices, discrete components, and MOSFETs (spin-off from NXP/Philips, headquartered in the Netherlands).
Application
- 12‑bit data path buffering for microcontrollers/DSPs and peripherals
- Bidirectional bus transceiver to bridge devices across different logic levels
- Level shifting in mixed‑voltage systems
- Backplane or interconnects in consumer electronics, automotive, and industrial equipment
- Buffering/fan‑out for memory‑mapped I/O and display/data buses
- Prototyping and test fixtures requiring robust, high‑speed signal distribution