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Спецификации
| Атрибут | Ценность |
| Package | Bulk |
| ProductStatus | Obsolete |
| MemoryType | Non-Volatile |
| MemoryFormat | FLASH |
| Technology | FLASH - NAND |
| MemorySize | 4Gb (512M x 8) |
| MemoryInterface | Parallel |
| Voltage-Supply | 2.7V ~ 3.6V |
| OperatingTemperature | -40°C ~ 85°C (TA) |
| MountingType | Surface Mount |
| Package/Case | 63-VFBGA |
Обзор
Description
MT29F4G08ABAEAH4-IT:E is Micron’s 4‑Gbit NAND flash memory. It’s a NAND flash device designed for non-volatile storage in embedded systems, consumer electronics, and light‑to‑mid‑range storage applications. The IT suffix indicates an industrial-temperature variant, suitable for wider operating ranges (e.g., harsh or embedded environments) than commercial parts. The device uses a parallel ONFi-compatible NAND interface and is organized into blocks and pages; a host controller issues standard NAND commands (read, program, erase) with required ECC and wear‑leveling handled by the controller or firmware. Typical uses include embedded storage in industrial devices, USB/SD storage, cameras, and companion storage in portable electronics. For exact electrical characteristics (page/block sizes, voltage, timing, and the precise command set) consult the official Micron MT29F4G08ABAEAH4-IT:E datasheet.
Features
MT29F4G08ABAEAH4-IT:E is Micron’s 4 Gbit NAND Flash (MLC) device. Key features include:
- Industrial temperature grade: -40°C to 85°C.
- ONFI-compatible interface.
- Organization: 4 Gbit total, 2 KB data pages with 64 B spare; 64 pages per erase block (≈32,768 blocks total).
- Support for multi-plane/interleaved operation to boost throughput.
- Built-in wear leveling and bad-block management; data retention ~10 years.
- Endurance typical in the 10K–30K program/erase (P/E) cycle range ( per block; varies by grade).
- ECC considerations: device requires host ECC (BCH) or equivalent; provides error detection/recovery support.
- Low-power standby and normal operation modes.
Note: exact timing, peak throughput, voltage specs, and ECC implementation details should be verified in the official MT29F4G08ABAEAH4-IT:E datasheet for precise design use.
- Industrial temperature grade: -40°C to 85°C.
- ONFI-compatible interface.
- Organization: 4 Gbit total, 2 KB data pages with 64 B spare; 64 pages per erase block (≈32,768 blocks total).
- Support for multi-plane/interleaved operation to boost throughput.
- Built-in wear leveling and bad-block management; data retention ~10 years.
- Endurance typical in the 10K–30K program/erase (P/E) cycle range ( per block; varies by grade).
- ECC considerations: device requires host ECC (BCH) or equivalent; provides error detection/recovery support.
- Low-power standby and normal operation modes.
Note: exact timing, peak throughput, voltage specs, and ECC implementation details should be verified in the official MT29F4G08ABAEAH4-IT:E datasheet for precise design use.
Pinout
- Pin count: 48 pins
- Function: 4Gbit, 8-bit wide NAND flash memory (MT29F4G08ABAEAH4-IT:E), with standard NAND signals:
- Data I/O: DQ0–DQ7 (8-bit bidirectional)
- Address: A0…A(x) (address inputs for page, block, etc.)
- Command/Address control: CLE (Command Latch Enable), ALE (Address Latch Enable)
- Clock/Enable: WE_N (Write Enable), RE_N (Read Enable), CE_N (Chip Enable)
- Misc: WP_N (Write Protect), R/B_N (Ready/Busy)
- Power/Ground: VCC/VCCQ (power), VSS (ground), plus NCs as applicable
- Function: 4Gbit, 8-bit wide NAND flash memory (MT29F4G08ABAEAH4-IT:E), with standard NAND signals:
- Data I/O: DQ0–DQ7 (8-bit bidirectional)
- Address: A0…A(x) (address inputs for page, block, etc.)
- Command/Address control: CLE (Command Latch Enable), ALE (Address Latch Enable)
- Clock/Enable: WE_N (Write Enable), RE_N (Read Enable), CE_N (Chip Enable)
- Misc: WP_N (Write Protect), R/B_N (Ready/Busy)
- Power/Ground: VCC/VCCQ (power), VSS (ground), plus NCs as applicable
Manufacturer
Manufacturer: Micron Technology, Inc. It is an American multinational semiconductor company that designs and manufactures memory and storage technologies, including DRAM and NAND/NOR flash, for electronics and computing markets.
Application
MT29F4G08ABAEAH4-IT:E is a 4Gbit NAND flash with industrial-temperature rating. Applications include primary storage in embedded systems and consumer electronics (smartphones, tablets, digital cameras, camcorders, USB drives, memory cards), NAND for SSDs (client/enterprise), and firmware/boot storage in automotive and industrial equipment. Its wide operating temperature and rugged reliability suit automotive infotainment, telematics, industrial automation, and IoT edge devices.
Package
48-pin TSOP (Thin Small Outline Package) for the MT29F4G08ABAEAH4-IT:E NAND flash.